Numerical simulations of a scanning force microscope with a large-amplitude vibrating cantilever

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Published in:Nanotechnology 1994-10, Vol.5 (4), p.199-204
Main Authors: Chen, Jian, Workman, R K, Sarid, D, Hoper, R
Format: Article
Language:English
Subjects:
Atomic force microscopes
Exact sciences and technology
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Physics
Scanning probe microscopes, components and techniques
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container_end_page 204
container_issue 4
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container_title Nanotechnology
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creator Chen, Jian
Workman, R K
Sarid, D
Hoper, R
description
doi_str_mv 10.1088/0957-4484/5/4/003
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ispartof Nanotechnology, 1994-10, Vol.5 (4), p.199-204
issn 0957-4484
1361-6528
language eng
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source Institute of Physics; Institute of Physics:Jisc Collections:IOP Publishing Journal Archive 1874-1998 (access period 2020 to 2024)
subjects Atomic force microscopes
Exact sciences and technology
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Physics
Scanning probe microscopes, components and techniques
title Numerical simulations of a scanning force microscope with a large-amplitude vibrating cantilever
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