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Investigations of electronic structures of defects introduced by Ar ion bombardments on MoS2 scanning tunneling microscopy
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Published in: | Japanese journal of applied physics 1995-06, Vol.34 (6B), p.3363-3367 |
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Main Authors: | , |
Format: | Article |
Language: | English |
Subjects: | |
Online Access: | Get full text |
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ISSN: | 0021-4922 1347-4065 |
DOI: | 10.1143/JJAP.34.3363 |