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Investigations of electronic structures of defects introduced by Ar ion bombardments on MoS2 scanning tunneling microscopy

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Bibliographic Details
Published in:Japanese journal of applied physics 1995-06, Vol.34 (6B), p.3363-3367
Main Authors: SENGOKU, N, OGAWA, K
Format: Article
Language:English
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ISSN:0021-4922
1347-4065
DOI:10.1143/JJAP.34.3363