Reflectivity analysis of ZnS layers grown on GaAs and Si substrates by metal organic vapour-phase epitaxy

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Bibliographic Details
Published in:Semiconductor science and technology 1994-02, Vol.9 (2), p.207-209
Main Authors: Briot, O, Briot, N, Abounadi, A, Gil, B, Cloitre, T, Aulombard, R L
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Cross-disciplinary physics: materials science
rheology
Exact sciences and technology
Materials science
Methods of deposition of films and coatings
film growth and epitaxy
Physics
Structure of solids and liquids
crystallography
Vapor phase epitaxy
growth from vapor phase
X-ray absorption spectroscopy: exafs, nexafs, xanes, etc
X-ray diffraction and scattering
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ISSN:0268-1242
1361-6641
DOI:10.1088/0268-1242/9/2/013