Critical currents in submicron YBa2Cu3O7 lines

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Bibliographic Details
Published in:IEEE transactions on applied superconductivity 1993-03, Vol.3 (1), p.2983-2985
Main Authors: ASSINK, H, VAN DEN HARG, A. J. M, SCHEP, C. M, CHEN, N. Y, VAN DEN MAREL, D, HADLEY, P, VAN DEN DRIFT, E. W. J. M, MOOIJ, J. E
Format: Article
Language:English
Subjects:
Analog circuits
Applied sciences
Circuit properties
Electric, optical and optoelectronic circuits
Electronic circuits
Electronics
Exact sciences and technology
Online Access:Get full text
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ISSN:1051-8223
1558-2515
DOI:10.1109/77.234030