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In situ electronic transport measurement as a tool for investigating the 2D doping in metal-C60 interfacial systems

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Bibliographic Details
Published in:	Journal of physics. Condensed matter 1994-10, Vol.6 (41), p.L631-L636
Main Authors:	Zhao, W B, Chen, J, Wu, K, Zhang, J L, Li, C Y, Yin, D L, Gu, Z N, Zhou, H, Jin, Z X
Format:	Article
Language:	English
Subjects:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures Electronic transport in interface structures Exact sciences and technology Metal-nonmetal contacts Physics
Online Access:	Get full text
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