Sources of high power ion beams for technological applications

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Bibliographic Details
Main Authors: ISAKOV, I. F, KOLODII, V. N, OPEKUNOV, M. S, MATVIENKO, V. M, PECHENKIN, S. A, REMNEV, G. E, USOV, Y. P
Format: Conference Proceeding
Language:English
Subjects:
Atomic, molecular and charged-particle sources and detectors
Charged-particle beam sources and detectors
Exact sciences and technology
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Physics
Online Access:Get full text
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ISSN:0042-207X
1879-2715