Modeling the ion‐source performance of an electron‐beam ion trap (invited)

Several key features of the electron‐beam ion trap (EBIT) enable it to provide superior ion‐source performance for many applications requiring ultra‐high‐charged ions. This paper briefly reviews these features and the operating conditions in the existing EBITs. The present performance of the EBIT as...

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Bibliographic Details
Published in:Review of Scientific Instruments 1992-04, Vol.63 (4), p.2806-2811
Main Authors: Penetrante, B. M., Schneider, D., Marrs, R. E., Bardsley, J. N.
Format: Article
Language:English
Subjects:
430301 - Particle Accelerators- Ion Sources
Atomic, molecular and charged-particle sources and detectors
BEAMS
CHARGED PARTICLES
Charged-particle beam sources and detectors
DESIGN
DYSPROSIUM IONS
ELECTRON BEAMS
Exact sciences and technology
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
ION SOURCES
IONS
LEPTON BEAMS
OPERATION
PARTICLE ACCELERATORS
PARTICLE BEAMS
Physics
THORIUM IONS
TRAPPING
URANIUM IONS
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Summary:Several key features of the electron‐beam ion trap (EBIT) enable it to provide superior ion‐source performance for many applications requiring ultra‐high‐charged ions. This paper briefly reviews these features and the operating conditions in the existing EBITs. The present performance of the EBIT as an ion source is demonstrated by producing and extracting ions up to Th80+ and U70+ at microsecond‐wide ion beam pulses of about 104 ions per second. Using as examples the production of U92+, U90+, and Dy66+, modeling results are presented to show how the fundamental processes limit the quality and quantity of ions that can be obtained from an upscaled EBIT.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.1142812