Surface morphology and crystal quality of in situ grown epitaxial La2-xSrxCuO4 thin films

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Bibliographic Details
Published in:Japanese journal of applied physics 1993, Vol.32 (4), p.1617-1620
Main Authors: TEHERANI, F. H, TANABE, K, SUZUKI, M
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Physics
Solid surfaces and solid-solid interfaces
Surface and interface dynamics and vibrations
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Thin film structure and morphology
Online Access:Get full text
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ISSN:0021-4922
1347-4065