Thick-film cermets, their physical properties and application

Thick-film cermets have been characterized. Relations describing their temperature dependence of resistance, piezoresistivity, 1/f noise and AC conductivity have been given on the basis of the percolation theory.

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Bibliographic Details
Published in:International journal of electronics 1990-07, Vol.69 (1), p.79-86
Main Author: LICZNERSKI, B. W.
Format: Article
Language:English
Subjects:
Applied sciences
Electronic equipment and fabrication. Passive components, printed wiring boards, connectics
Electronics
Exact sciences and technology
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Description
Summary:Thick-film cermets have been characterized. Relations describing their temperature dependence of resistance, piezoresistivity, 1/f noise and AC conductivity have been given on the basis of the percolation theory.
ISSN:0020-7217
1362-3060
DOI:10.1080/00207219008920293