Reliability of electron devices, failure physics and analysis

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Bibliographic Details
Main Authors: GROESENEKEN, Guido, MAES, Herman E, MOUTHAAN, Anton J, VERWEIJ, Jan F
Format: Conference Proceeding
Language:English
Subjects:
Applied sciences
Electronics
Exact sciences and technology
Testing, measurement, noise and reliability
Online Access:Get full text
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ISSN:0026-2714
1872-941X