Reliability physics of advanced electron devices

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Bibliographic Details
Published in:Microelectronics and reliability 1995-03, Vol.35 (3)
Main Authors: DUMMER, G. W. A, STOJADINOVIC, N. D
Format: Article
Language:English
Subjects:
Applied sciences
Design. Technologies. Operation analysis. Testing
Electronics
Exact sciences and technology
Integrated circuits
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Online Access:Get full text
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ISSN:0026-2714
1872-941X
DOI:10.1016/0026-2714(95)90024-1