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Characterization of vanadium diffusion barriers in Nb-Sn composite wires
Ductile vanadium has been explored for use as a diffusion barrier material in niobium-tin composite wires. Vanadium is found to co-process well, standing over 99.995% area reduction without anneal. Resistance ratios greater than 300 to 1 (0°c to 20K) have been measured in reacted composite wire with...
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Published in: | IEEE transactions on magnetics 1987-03, Vol.23 (2), p.1347-1350 |
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container_title | IEEE transactions on magnetics |
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creator | Smathers, D. O'Larey, P. Siddall, M. Peterson, J. McDonald, Wm |
description | Ductile vanadium has been explored for use as a diffusion barrier material in niobium-tin composite wires. Vanadium is found to co-process well, standing over 99.995% area reduction without anneal. Resistance ratios greater than 300 to 1 (0°c to 20K) have been measured in reacted composite wire with noncopper current densities greater than 1700 A/mm 2 at 10 Tesla, 4.2K. Vanadium forms an intermetallic compound on the tin side which should not be superconducting above 4.2K. The composite residual resistance ratio (RRR) is seen to be dependent on reaction conditions being higher as the reaction temperature is dropped. To determine the source of this effect a copper-vanadium composite was fabricated. Features similar to the superconducting wire were observed. There is a reasonable overlap of reaction conditions suitable for both the superconductor and the copper making high RRR possible for optimized conductors. |
doi_str_mv | 10.1109/TMAG.1987.1064896 |
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Vanadium is found to co-process well, standing over 99.995% area reduction without anneal. Resistance ratios greater than 300 to 1 (0°c to 20K) have been measured in reacted composite wire with noncopper current densities greater than 1700 A/mm 2 at 10 Tesla, 4.2K. Vanadium forms an intermetallic compound on the tin side which should not be superconducting above 4.2K. The composite residual resistance ratio (RRR) is seen to be dependent on reaction conditions being higher as the reaction temperature is dropped. To determine the source of this effect a copper-vanadium composite was fabricated. Features similar to the superconducting wire were observed. There is a reasonable overlap of reaction conditions suitable for both the superconductor and the copper making high RRR possible for optimized conductors.</description><identifier>ISSN: 0018-9464</identifier><identifier>EISSN: 1941-0069</identifier><identifier>DOI: 10.1109/TMAG.1987.1064896</identifier><identifier>CODEN: IEMGAQ</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Annealing ; Applications ; Applied sciences ; Composite materials ; Cross-disciplinary physics: materials science; rheology ; Current density ; Current measurement ; Density measurement ; Electrical resistance measurement ; Engineering techniques in metallurgy. Applications. Other aspects ; Exact sciences and technology ; Intermetallic ; Materials science ; Metals, semimetals and alloys ; Metals. 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Vanadium is found to co-process well, standing over 99.995% area reduction without anneal. Resistance ratios greater than 300 to 1 (0°c to 20K) have been measured in reacted composite wire with noncopper current densities greater than 1700 A/mm 2 at 10 Tesla, 4.2K. Vanadium forms an intermetallic compound on the tin side which should not be superconducting above 4.2K. The composite residual resistance ratio (RRR) is seen to be dependent on reaction conditions being higher as the reaction temperature is dropped. To determine the source of this effect a copper-vanadium composite was fabricated. Features similar to the superconducting wire were observed. There is a reasonable overlap of reaction conditions suitable for both the superconductor and the copper making high RRR possible for optimized conductors.</description><subject>Annealing</subject><subject>Applications</subject><subject>Applied sciences</subject><subject>Composite materials</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Current density</subject><subject>Current measurement</subject><subject>Density measurement</subject><subject>Electrical resistance measurement</subject><subject>Engineering techniques in metallurgy. Applications. Other aspects</subject><subject>Exact sciences and technology</subject><subject>Intermetallic</subject><subject>Materials science</subject><subject>Metals, semimetals and alloys</subject><subject>Metals. Metallurgy</subject><subject>Niobium-tin</subject><subject>Others aspects</subject><subject>Physics</subject><subject>Specific materials</subject><subject>Superconducting filaments and wires</subject><subject>Tin</subject><issn>0018-9464</issn><issn>1941-0069</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1987</creationdate><recordtype>article</recordtype><recordid>eNqNkU1Lw0AQhhdRsFZ_gHjJQbyl7lf241iKtkLVg_W8bJJZXMlH3U0U_fU2pIg3PQ0zPPPMwIvQOcEzQrC-3tzPlzOilZwRLLjS4gBNiOYkxVjoQzTBmKhUc8GP0UmMr7uWZwRP0GrxYoMtOgj-y3a-bZLWJe-2saXv66T0zvVxmOY2BA8hJr5JHvL0qUmKtt620XeQfPgA8RQdOVtFONvXKXq-vdksVun6cXm3mK_TghPVpdzJzCkGkDMirOIl4IxkHMtSCJc7zokWUhWgBdZMciocOMsYMEmooBLYFF2N3m1o33qInal9LKCqbANtHw1VSmWK8n-AkmWY0X-AFEvN2d8gZ4oyNZwmI1iENsYAzmyDr234NASbIS4zxGWGuMw-rt3O5V5uY2ErF2xT-PizKDPKtBievRgxDwC_tKPkG7fOnGU</recordid><startdate>19870301</startdate><enddate>19870301</enddate><creator>Smathers, D.</creator><creator>O'Larey, P.</creator><creator>Siddall, M.</creator><creator>Peterson, J.</creator><creator>McDonald, Wm</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><scope>8BQ</scope><scope>JG9</scope></search><sort><creationdate>19870301</creationdate><title>Characterization of vanadium diffusion barriers in Nb-Sn composite wires</title><author>Smathers, D. ; O'Larey, P. ; Siddall, M. ; Peterson, J. ; McDonald, Wm</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c418t-4f75f83eeb316a84de0515407d66fbf4419678ce960937426fefa33e3712627e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1987</creationdate><topic>Annealing</topic><topic>Applications</topic><topic>Applied sciences</topic><topic>Composite materials</topic><topic>Cross-disciplinary physics: materials science; rheology</topic><topic>Current density</topic><topic>Current measurement</topic><topic>Density measurement</topic><topic>Electrical resistance measurement</topic><topic>Engineering techniques in metallurgy. Applications. Other aspects</topic><topic>Exact sciences and technology</topic><topic>Intermetallic</topic><topic>Materials science</topic><topic>Metals, semimetals and alloys</topic><topic>Metals. Metallurgy</topic><topic>Niobium-tin</topic><topic>Others aspects</topic><topic>Physics</topic><topic>Specific materials</topic><topic>Superconducting filaments and wires</topic><topic>Tin</topic><toplevel>online_resources</toplevel><creatorcontrib>Smathers, D.</creatorcontrib><creatorcontrib>O'Larey, P.</creatorcontrib><creatorcontrib>Siddall, M.</creatorcontrib><creatorcontrib>Peterson, J.</creatorcontrib><creatorcontrib>McDonald, Wm</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>METADEX</collection><collection>Materials Research Database</collection><jtitle>IEEE transactions on magnetics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Smathers, D.</au><au>O'Larey, P.</au><au>Siddall, M.</au><au>Peterson, J.</au><au>McDonald, Wm</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Characterization of vanadium diffusion barriers in Nb-Sn composite wires</atitle><jtitle>IEEE transactions on magnetics</jtitle><stitle>TMAG</stitle><date>1987-03-01</date><risdate>1987</risdate><volume>23</volume><issue>2</issue><spage>1347</spage><epage>1350</epage><pages>1347-1350</pages><issn>0018-9464</issn><eissn>1941-0069</eissn><coden>IEMGAQ</coden><abstract>Ductile vanadium has been explored for use as a diffusion barrier material in niobium-tin composite wires. Vanadium is found to co-process well, standing over 99.995% area reduction without anneal. Resistance ratios greater than 300 to 1 (0°c to 20K) have been measured in reacted composite wire with noncopper current densities greater than 1700 A/mm 2 at 10 Tesla, 4.2K. Vanadium forms an intermetallic compound on the tin side which should not be superconducting above 4.2K. The composite residual resistance ratio (RRR) is seen to be dependent on reaction conditions being higher as the reaction temperature is dropped. To determine the source of this effect a copper-vanadium composite was fabricated. Features similar to the superconducting wire were observed. There is a reasonable overlap of reaction conditions suitable for both the superconductor and the copper making high RRR possible for optimized conductors.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TMAG.1987.1064896</doi><tpages>4</tpages></addata></record> |
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subjects | Annealing Applications Applied sciences Composite materials Cross-disciplinary physics: materials science rheology Current density Current measurement Density measurement Electrical resistance measurement Engineering techniques in metallurgy. Applications. Other aspects Exact sciences and technology Intermetallic Materials science Metals, semimetals and alloys Metals. Metallurgy Niobium-tin Others aspects Physics Specific materials Superconducting filaments and wires Tin |
title | Characterization of vanadium diffusion barriers in Nb-Sn composite wires |
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