Electrical resistance in ion beam mixed Al/Si thin films

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Bibliographic Details
Main Authors: XIAO-XING XI, QI-ZE RAN, JIA-RUI LIU, WEI-YAN GUAN
Format: Conference Proceeding
Language:English
Subjects:
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Cross-disciplinary physics: materials science
rheology
Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures
Electronic transport in interface structures
Exact sciences and technology
Materials science
Metals, semimetals and alloys
Physics
Specific materials
Online Access:Get full text
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ISSN:0021-4922
1347-4065