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Carrier transport in semiconductor detectors of magnetic domains
Carrier transport in Hall-type devices detecting magnetic domains is analyzed in terms of a two-dimensional numerical model, using a finite element scheme. The numerical model allows the calculation of magnetic sensitivity for general device geometries or structures, any homogeneous semiconductor ma...
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Published in: | IEEE transactions on electron devices 1987-10, Vol.34 (10), p.2077-2085 |
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container_end_page | 2085 |
container_issue | 10 |
container_start_page | 2077 |
container_title | IEEE transactions on electron devices |
container_volume | 34 |
creator | Nathan, A. Allegretto, W. Baltes, H.P. Sugiyama, Y. |
description | Carrier transport in Hall-type devices detecting magnetic domains is analyzed in terms of a two-dimensional numerical model, using a finite element scheme. The numerical model allows the calculation of magnetic sensitivity for general device geometries or structures, any homogeneous semiconductor material, and arbitrary domain shapes and sizes. We specifically consider three types of commonly used Hall detectors: the conventional Hall plate, the split-electrode Hall device, and the Hall cross. The magnetic sensitivity for these devices is computed for various domain configurations. In particular, the device's output response for moving domains is investigated and appropriate figures of merit are established with respect to spatial resolution. A comparison of the numerical solutions with previously reported experimental results supports the validity of our analysis. |
doi_str_mv | 10.1109/T-ED.1987.23201 |
format | article |
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The numerical model allows the calculation of magnetic sensitivity for general device geometries or structures, any homogeneous semiconductor material, and arbitrary domain shapes and sizes. We specifically consider three types of commonly used Hall detectors: the conventional Hall plate, the split-electrode Hall device, and the Hall cross. The magnetic sensitivity for these devices is computed for various domain configurations. In particular, the device's output response for moving domains is investigated and appropriate figures of merit are established with respect to spatial resolution. 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The numerical model allows the calculation of magnetic sensitivity for general device geometries or structures, any homogeneous semiconductor material, and arbitrary domain shapes and sizes. We specifically consider three types of commonly used Hall detectors: the conventional Hall plate, the split-electrode Hall device, and the Hall cross. The magnetic sensitivity for these devices is computed for various domain configurations. In particular, the device's output response for moving domains is investigated and appropriate figures of merit are established with respect to spatial resolution. A comparison of the numerical solutions with previously reported experimental results supports the validity of our analysis.</description><subject>Applied sciences</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Magnetic devices</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. 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Solid state devices</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Nathan, A.</creatorcontrib><creatorcontrib>Allegretto, W.</creatorcontrib><creatorcontrib>Baltes, H.P.</creatorcontrib><creatorcontrib>Sugiyama, Y.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on electron devices</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Nathan, A.</au><au>Allegretto, W.</au><au>Baltes, H.P.</au><au>Sugiyama, Y.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Carrier transport in semiconductor detectors of magnetic domains</atitle><jtitle>IEEE transactions on electron devices</jtitle><stitle>TED</stitle><date>1987-10-01</date><risdate>1987</risdate><volume>34</volume><issue>10</issue><spage>2077</spage><epage>2085</epage><pages>2077-2085</pages><issn>0018-9383</issn><eissn>1557-9646</eissn><coden>IETDAI</coden><abstract>Carrier transport in Hall-type devices detecting magnetic domains is analyzed in terms of a two-dimensional numerical model, using a finite element scheme. The numerical model allows the calculation of magnetic sensitivity for general device geometries or structures, any homogeneous semiconductor material, and arbitrary domain shapes and sizes. We specifically consider three types of commonly used Hall detectors: the conventional Hall plate, the split-electrode Hall device, and the Hall cross. The magnetic sensitivity for these devices is computed for various domain configurations. In particular, the device's output response for moving domains is investigated and appropriate figures of merit are established with respect to spatial resolution. A comparison of the numerical solutions with previously reported experimental results supports the validity of our analysis.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/T-ED.1987.23201</doi><tpages>9</tpages></addata></record> |
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source | IEEE Xplore (Online service) |
subjects | Applied sciences Electronics Exact sciences and technology Magnetic devices Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices |
title | Carrier transport in semiconductor detectors of magnetic domains |
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