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Low‐energy electron diffraction system using a position‐sensitive detector
A low‐energy electron diffraction (LEED) system using a position‐sensitive detector is described. The design requirements for LEED observations are outlined. Most of these requirements are realized in a system incorporating a miniature, movable electron gun and a position‐sensitive detector of the r...
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Published in: | Review of scientific instruments 1985-11, Vol.56 (11), p.2077-2083 |
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Main Authors: | , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | A low‐energy electron diffraction (LEED) system using a position‐sensitive detector is described. The design requirements for LEED observations are outlined. Most of these requirements are realized in a system incorporating a miniature, movable electron gun and a position‐sensitive detector of the resistive anode type, interfaced to a computer. This system has been used to make 128×128 channel digital records of LED patterns. The speed of data acquisition is limited by the detector hardware and is 20 kHz. Records of good quality (0.1° instrumental angular resolving power) can be made by counting 5×105 electrons. Illustrative applications to silicon and tungsten crystal surfaces and prospects for improving the system are described. |
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ISSN: | 0034-6748 1089-7623 |
DOI: | 10.1063/1.1138423 |