Comparison of surface and volume coercive field of sputtered CoCr thin films

Thin films of the perpendicular recording material Co 78.5 Cr 21.5 were prepared by RF sputtering from a composite target. The film thickness was varied from 31 nm to 773 nm. Using Si

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Bibliographic Details
Published in:IEEE transactions on magnetics 1984-01, Vol.20 (1), p.60-62
Main Authors: Smits, J., Luitjens, S., Geuskens, R.
Format: Article
Language:English
Subjects:
Chromium
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Cross-disciplinary physics: materials science
rheology
Exact sciences and technology
Magnetic field measurement
Magnetic films
Magnetic properties and materials
Magnetic properties of surface, thin films and multilayers
Magnetometers
Materials science
Metals, semimetals and alloys
Optical films
Perpendicular magnetic recording
Physics
Radio frequency
Specific materials
Sputtering
Substrates
Surface cracks
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Description
Summary:Thin films of the perpendicular recording material Co 78.5 Cr 21.5 were prepared by RF sputtering from a composite target. The film thickness was varied from 31 nm to 773 nm. Using Si
ISSN:0018-9464
1941-0069
DOI:10.1109/TMAG.1984.1063018