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Scanning delay generator for measurement of kinetic decays using laser‐induced fluorescence techniques

An electronic device is described which generates a delayed pulse, where the delay is increased in a step‐like manner. This device finds application in the measurement of kinetic decays, particularly when laser‐induced fluorescent (LIF) detection of the decaying species is used. The circuit uses 15...

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Bibliographic Details
Published in:Review of scientific instruments 1982-11, Vol.53 (11), p.1786-1788
Main Authors: Halpern, Joshua B., Towns, Theodore G.
Format: Article
Language:English
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Summary:An electronic device is described which generates a delayed pulse, where the delay is increased in a step‐like manner. This device finds application in the measurement of kinetic decays, particularly when laser‐induced fluorescent (LIF) detection of the decaying species is used. The circuit uses 15 low‐power Schottky TTL chips and is contained within a dual width NIM module.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.1136863