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Novel mechanism for tunneling and breakdown of thin SiO2 films

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Bibliographic Details
Published in:Physical review letters 1983, Vol.51 (19), p.1795-1798
Main Authors: RICCO, B, AZBEL, M. Y, BRODSKY, M. H
Format: Article
Language:English
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ISSN:0031-9007
1079-7114
DOI:10.1103/PhysRevLett.51.1795