Microwave dielectric properties and microstructures of Nd(Mg0.5−xCoxSn0.5)O3 ceramics

• Published in: Journal of materials science. Materials in electronics 2012-07, Vol.23 (7), p.1320-1326
• Main Authors: Chen, Yih-Chien, Yao, Shi-Li, Wu, Chung-Yen
• Format: Article
• Language: English
• Subjects: Applied sciences; Characterization and Evaluation of Materials; Chemistry and Materials Science; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Condensed matter: structure, mechanical and thermal properties; Dielectric properties of solids and liquids; Dielectrics, piezoelectrics, and ferroelectrics and their properties; Electronics; Exact sciences and technology; Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties; Materials Science; Microwave and submillimeter wave devices, electron transfer devices; Optical and Electronic Materials; Permittivity (dielectric function); Physics; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)
• ISSN: 0957-4522; 1573-482X
• DOI: 10.1007/s10854-011-0591-7

This study elucidates the microwave dielectric properties and microstructures of Nd(Mg 0.5−x Co x Sn 0.5 )O 3 ceramics with a view to their potential for microwave devices. The Nd(Mg 0.5−x Co x Sn 0.5 )O 3 ceramics were prepared by the conventional solid-state method with various sintering temperatures. The X-ray diffraction patterns of the Nd(Mg 0.45 Co 0.05 Sn 0.5 )O 3 ceramics revealed no significant variation of phase with sintering temperatures. A dielectric constant (ɛ r ) of 19.2, a quality factor ( Q  ×  f ) of 68,900 GHz, and a temperature coefficient of resonant frequency (τ f ) of −67 ppm/°C were obtained for Nd(Mg 0.45 Co 0.05 Sn 0.5 )O 3 ceramics that were sintered at 1,550 °C for 4 h.