Mismatch Shaping Techniques to Linearize Charge Pump Errors in Fractional-[Formula Omitted] PLLs

A recent charge pump linearization technique demonstrated 8 dB reduction in spurious tones caused by charge pump current mismatch in delta-sigma fractional-[Formula Omitted] phase locked loops. In this paper, two purely digital mismatch shaping techniques are proposed to modify and further improve t...

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Published in:IEEE transactions on circuits and systems. I, Regular papers Regular papers, 2010-06, Vol.57 (6), p.1221
Main Authors: Su, Pin-En, Pamarti, Sudhakar
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description A recent charge pump linearization technique demonstrated 8 dB reduction in spurious tones caused by charge pump current mismatch in delta-sigma fractional-[Formula Omitted] phase locked loops. In this paper, two purely digital mismatch shaping techniques are proposed to modify and further improve the charge pump linearization technique. Both the techniques suppress spurious tones by randomizing the residual charge pump mismatch error power. The second technique further spectrally shapes the residual charge pump mismatch errors to suppress close-in phase noise. No spurs are observed and -120 dBc/Hz phase noise is achieved at frequency offsets lower than 10 kHz in simulation. A theoretical proof of the spectral shaping of the charge pump mismatch error power is also presented.
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fullrecord <record><control><sourceid>proquest</sourceid><recordid>TN_cdi_proquest_journals_1027215657</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2717101091</sourcerecordid><originalsourceid>FETCH-proquest_journals_10272156573</originalsourceid><addsrcrecordid>eNqNjc1qwkAUhQdpQdv6AO4uuI7emZi_dTC0EKlgdiI6pFMzksykdyabPn0j-ADdnO8svsNhbMFxxTlm6yo_fKwEYjZGyJNNPGEzHkVpgCnGT_e-yYI0FOmUvTh3QxTZ6M3YZaddJ33dwKGRvTZXqFTdGP0zKAfeQqmNkqR_FeSNpKuC_dD1sCWy5EAbKEjWXlsj2-BYWOqGVsJnp71XXyfYl6V7Y8_fsnVq_uArWxbbKn8PerL3E3--2YHGvTtzFIngURwl4f-sP-lCSwY</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1027215657</pqid></control><display><type>article</type><title>Mismatch Shaping Techniques to Linearize Charge Pump Errors in Fractional-[Formula Omitted] PLLs</title><source>IEEE Electronic Library (IEL) Journals</source><creator>Su, Pin-En ; Pamarti, Sudhakar</creator><creatorcontrib>Su, Pin-En ; Pamarti, Sudhakar</creatorcontrib><description>A recent charge pump linearization technique demonstrated 8 dB reduction in spurious tones caused by charge pump current mismatch in delta-sigma fractional-[Formula Omitted] phase locked loops. In this paper, two purely digital mismatch shaping techniques are proposed to modify and further improve the charge pump linearization technique. Both the techniques suppress spurious tones by randomizing the residual charge pump mismatch error power. The second technique further spectrally shapes the residual charge pump mismatch errors to suppress close-in phase noise. No spurs are observed and -120 dBc/Hz phase noise is achieved at frequency offsets lower than 10 kHz in simulation. A theoretical proof of the spectral shaping of the charge pump mismatch error power is also presented.</description><identifier>ISSN: 1549-8328</identifier><identifier>EISSN: 1558-0806</identifier><identifier>DOI: 10.1109/TCSI.2009.2031746</identifier><language>eng</language><publisher>New York: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</publisher><ispartof>IEEE transactions on circuits and systems. I, Regular papers, 2010-06, Vol.57 (6), p.1221</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Jun 2010</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27922,27923</link.rule.ids></links><search><creatorcontrib>Su, Pin-En</creatorcontrib><creatorcontrib>Pamarti, Sudhakar</creatorcontrib><title>Mismatch Shaping Techniques to Linearize Charge Pump Errors in Fractional-[Formula Omitted] PLLs</title><title>IEEE transactions on circuits and systems. I, Regular papers</title><description>A recent charge pump linearization technique demonstrated 8 dB reduction in spurious tones caused by charge pump current mismatch in delta-sigma fractional-[Formula Omitted] phase locked loops. In this paper, two purely digital mismatch shaping techniques are proposed to modify and further improve the charge pump linearization technique. Both the techniques suppress spurious tones by randomizing the residual charge pump mismatch error power. The second technique further spectrally shapes the residual charge pump mismatch errors to suppress close-in phase noise. No spurs are observed and -120 dBc/Hz phase noise is achieved at frequency offsets lower than 10 kHz in simulation. A theoretical proof of the spectral shaping of the charge pump mismatch error power is also presented.</description><issn>1549-8328</issn><issn>1558-0806</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><recordid>eNqNjc1qwkAUhQdpQdv6AO4uuI7emZi_dTC0EKlgdiI6pFMzksykdyabPn0j-ADdnO8svsNhbMFxxTlm6yo_fKwEYjZGyJNNPGEzHkVpgCnGT_e-yYI0FOmUvTh3QxTZ6M3YZaddJ33dwKGRvTZXqFTdGP0zKAfeQqmNkqR_FeSNpKuC_dD1sCWy5EAbKEjWXlsj2-BYWOqGVsJnp71XXyfYl6V7Y8_fsnVq_uArWxbbKn8PerL3E3--2YHGvTtzFIngURwl4f-sP-lCSwY</recordid><startdate>20100601</startdate><enddate>20100601</enddate><creator>Su, Pin-En</creator><creator>Pamarti, Sudhakar</creator><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>20100601</creationdate><title>Mismatch Shaping Techniques to Linearize Charge Pump Errors in Fractional-[Formula Omitted] PLLs</title><author>Su, Pin-En ; Pamarti, Sudhakar</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-proquest_journals_10272156573</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Su, Pin-En</creatorcontrib><creatorcontrib>Pamarti, Sudhakar</creatorcontrib><collection>Electronics &amp; Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on circuits and systems. I, Regular papers</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Su, Pin-En</au><au>Pamarti, Sudhakar</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Mismatch Shaping Techniques to Linearize Charge Pump Errors in Fractional-[Formula Omitted] PLLs</atitle><jtitle>IEEE transactions on circuits and systems. I, Regular papers</jtitle><date>2010-06-01</date><risdate>2010</risdate><volume>57</volume><issue>6</issue><spage>1221</spage><pages>1221-</pages><issn>1549-8328</issn><eissn>1558-0806</eissn><abstract>A recent charge pump linearization technique demonstrated 8 dB reduction in spurious tones caused by charge pump current mismatch in delta-sigma fractional-[Formula Omitted] phase locked loops. In this paper, two purely digital mismatch shaping techniques are proposed to modify and further improve the charge pump linearization technique. Both the techniques suppress spurious tones by randomizing the residual charge pump mismatch error power. The second technique further spectrally shapes the residual charge pump mismatch errors to suppress close-in phase noise. No spurs are observed and -120 dBc/Hz phase noise is achieved at frequency offsets lower than 10 kHz in simulation. A theoretical proof of the spectral shaping of the charge pump mismatch error power is also presented.</abstract><cop>New York</cop><pub>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</pub><doi>10.1109/TCSI.2009.2031746</doi></addata></record>
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title Mismatch Shaping Techniques to Linearize Charge Pump Errors in Fractional-[Formula Omitted] PLLs
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-09T16%3A45%3A33IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Mismatch%20Shaping%20Techniques%20to%20Linearize%20Charge%20Pump%20Errors%20in%20Fractional-%5BFormula%20Omitted%5D%20PLLs&rft.jtitle=IEEE%20transactions%20on%20circuits%20and%20systems.%20I,%20Regular%20papers&rft.au=Su,%20Pin-En&rft.date=2010-06-01&rft.volume=57&rft.issue=6&rft.spage=1221&rft.pages=1221-&rft.issn=1549-8328&rft.eissn=1558-0806&rft_id=info:doi/10.1109/TCSI.2009.2031746&rft_dat=%3Cproquest%3E2717101091%3C/proquest%3E%3Cgrp_id%3Ecdi_FETCH-proquest_journals_10272156573%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=1027215657&rft_id=info:pmid/&rfr_iscdi=true