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Seesaw Relay Logic and Memory Circuits

Various logic functions can be implemented by appropriately biasing a single seesaw relay. The seesaw relay can also be configured as a bistable latch so that a memory cell can be implemented with one relay and one access transistor. Measurements of seesaw relay switching speed are well matched to l...

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Published in:Journal of microelectromechanical systems 2010-08, Vol.19 (4), p.1012-1014
Main Authors: Jaeseok Jeon, Pott, Vincent, Hei Kam, Nathanael, Rhesa, Alon, Elad, Tsu-Jae King Liu
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cited_by cdi_FETCH-LOGICAL-c357t-e9fbfc9a71584903c446bc26025826ed05628c3d453229d58d2c137a29c6a8133
cites cdi_FETCH-LOGICAL-c357t-e9fbfc9a71584903c446bc26025826ed05628c3d453229d58d2c137a29c6a8133
container_end_page 1014
container_issue 4
container_start_page 1012
container_title Journal of microelectromechanical systems
container_volume 19
creator Jaeseok Jeon
Pott, Vincent
Hei Kam
Nathanael, Rhesa
Alon, Elad
Tsu-Jae King Liu
description Various logic functions can be implemented by appropriately biasing a single seesaw relay. The seesaw relay can also be configured as a bistable latch so that a memory cell can be implemented with one relay and one access transistor. Measurements of seesaw relay switching speed are well matched to lumped-parameter modeling results.
doi_str_mv 10.1109/JMEMS.2010.2049826
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fullrecord <record><control><sourceid>proquest_pasca</sourceid><recordid>TN_cdi_proquest_journals_1027782048</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5471196</ieee_id><sourcerecordid>787233874</sourcerecordid><originalsourceid>FETCH-LOGICAL-c357t-e9fbfc9a71584903c446bc26025826ed05628c3d453229d58d2c137a29c6a8133</originalsourceid><addsrcrecordid>eNpdkE1LAzEQhoMoWKt_QC8Lop62ZibJJjlKqV-0CFbPIc1mZcu2W5Mu0n9vaksPniZDnpl5eQi5BDoAoPr-dTKaTAdIU4-Ua4XFEemB5pBTEOo4vamQuQQhT8lZjHNKgXNV9Mjt1Ptof7J339hNNm6_apfZZZlN_KINm2xYB9fV63hOTirbRH-xr33y-Tj6GD7n47enl-HDOHdMyHXudTWrnLbpkOKaMsd5MXNYUBQpki-pKFA5VnLBEHUpVIkOmLSoXWEVMNYnd7u9q9B-dz6uzaKOzjeNXfq2i0YqiYwpyRN5_Y-ct11YpnAGKEqpkgeVKNxRLrQxBl-ZVagXNmwSZLbmzJ85szVn9ubS0M1-tY3ONlWwS1fHwyQyEIBiG_Zqx9Xe-8O34BJAF-wX79VzMQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1027782048</pqid></control><display><type>article</type><title>Seesaw Relay Logic and Memory Circuits</title><source>IEEE Electronic Library (IEL) Journals</source><creator>Jaeseok Jeon ; Pott, Vincent ; Hei Kam ; Nathanael, Rhesa ; Alon, Elad ; Tsu-Jae King Liu</creator><creatorcontrib>Jaeseok Jeon ; Pott, Vincent ; Hei Kam ; Nathanael, Rhesa ; Alon, Elad ; Tsu-Jae King Liu</creatorcontrib><description>Various logic functions can be implemented by appropriately biasing a single seesaw relay. The seesaw relay can also be configured as a bistable latch so that a memory cell can be implemented with one relay and one access transistor. Measurements of seesaw relay switching speed are well matched to lumped-parameter modeling results.</description><identifier>ISSN: 1057-7157</identifier><identifier>EISSN: 1941-0158</identifier><identifier>DOI: 10.1109/JMEMS.2010.2049826</identifier><identifier>CODEN: JMIYET</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Circuits ; CMOS technology ; Digital relays ; Electrodes ; Exact sciences and technology ; Instruments, apparatus, components and techniques common to several branches of physics and astronomy ; Integrated circuit measurements ; Latches ; Logic ; Logic circuits ; Logic functions ; Mathematical models ; Mechanical instruments, equipment and techniques ; Microelectromechanical systems ; Micromechanical devices and systems ; Nanoelectromechanical systems ; Physics ; Relay ; relay logic and memory circuits ; Semiconductor devices ; Switching ; Transistors ; Velocity measurement ; Voltage</subject><ispartof>Journal of microelectromechanical systems, 2010-08, Vol.19 (4), p.1012-1014</ispartof><rights>2015 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Aug 2010</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c357t-e9fbfc9a71584903c446bc26025826ed05628c3d453229d58d2c137a29c6a8133</citedby><cites>FETCH-LOGICAL-c357t-e9fbfc9a71584903c446bc26025826ed05628c3d453229d58d2c137a29c6a8133</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5471196$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,54796</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=23151253$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Jaeseok Jeon</creatorcontrib><creatorcontrib>Pott, Vincent</creatorcontrib><creatorcontrib>Hei Kam</creatorcontrib><creatorcontrib>Nathanael, Rhesa</creatorcontrib><creatorcontrib>Alon, Elad</creatorcontrib><creatorcontrib>Tsu-Jae King Liu</creatorcontrib><title>Seesaw Relay Logic and Memory Circuits</title><title>Journal of microelectromechanical systems</title><addtitle>JMEMS</addtitle><description>Various logic functions can be implemented by appropriately biasing a single seesaw relay. The seesaw relay can also be configured as a bistable latch so that a memory cell can be implemented with one relay and one access transistor. Measurements of seesaw relay switching speed are well matched to lumped-parameter modeling results.</description><subject>Circuits</subject><subject>CMOS technology</subject><subject>Digital relays</subject><subject>Electrodes</subject><subject>Exact sciences and technology</subject><subject>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</subject><subject>Integrated circuit measurements</subject><subject>Latches</subject><subject>Logic</subject><subject>Logic circuits</subject><subject>Logic functions</subject><subject>Mathematical models</subject><subject>Mechanical instruments, equipment and techniques</subject><subject>Microelectromechanical systems</subject><subject>Micromechanical devices and systems</subject><subject>Nanoelectromechanical systems</subject><subject>Physics</subject><subject>Relay</subject><subject>relay logic and memory circuits</subject><subject>Semiconductor devices</subject><subject>Switching</subject><subject>Transistors</subject><subject>Velocity measurement</subject><subject>Voltage</subject><issn>1057-7157</issn><issn>1941-0158</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><recordid>eNpdkE1LAzEQhoMoWKt_QC8Lop62ZibJJjlKqV-0CFbPIc1mZcu2W5Mu0n9vaksPniZDnpl5eQi5BDoAoPr-dTKaTAdIU4-Ua4XFEemB5pBTEOo4vamQuQQhT8lZjHNKgXNV9Mjt1Ptof7J339hNNm6_apfZZZlN_KINm2xYB9fV63hOTirbRH-xr33y-Tj6GD7n47enl-HDOHdMyHXudTWrnLbpkOKaMsd5MXNYUBQpki-pKFA5VnLBEHUpVIkOmLSoXWEVMNYnd7u9q9B-dz6uzaKOzjeNXfq2i0YqiYwpyRN5_Y-ct11YpnAGKEqpkgeVKNxRLrQxBl-ZVagXNmwSZLbmzJ85szVn9ubS0M1-tY3ONlWwS1fHwyQyEIBiG_Zqx9Xe-8O34BJAF-wX79VzMQ</recordid><startdate>20100801</startdate><enddate>20100801</enddate><creator>Jaeseok Jeon</creator><creator>Pott, Vincent</creator><creator>Hei Kam</creator><creator>Nathanael, Rhesa</creator><creator>Alon, Elad</creator><creator>Tsu-Jae King Liu</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7TB</scope><scope>7U5</scope><scope>8FD</scope><scope>FR3</scope><scope>L7M</scope><scope>F28</scope></search><sort><creationdate>20100801</creationdate><title>Seesaw Relay Logic and Memory Circuits</title><author>Jaeseok Jeon ; Pott, Vincent ; Hei Kam ; Nathanael, Rhesa ; Alon, Elad ; Tsu-Jae King Liu</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c357t-e9fbfc9a71584903c446bc26025826ed05628c3d453229d58d2c137a29c6a8133</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Circuits</topic><topic>CMOS technology</topic><topic>Digital relays</topic><topic>Electrodes</topic><topic>Exact sciences and technology</topic><topic>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</topic><topic>Integrated circuit measurements</topic><topic>Latches</topic><topic>Logic</topic><topic>Logic circuits</topic><topic>Logic functions</topic><topic>Mathematical models</topic><topic>Mechanical instruments, equipment and techniques</topic><topic>Microelectromechanical systems</topic><topic>Micromechanical devices and systems</topic><topic>Nanoelectromechanical systems</topic><topic>Physics</topic><topic>Relay</topic><topic>relay logic and memory circuits</topic><topic>Semiconductor devices</topic><topic>Switching</topic><topic>Transistors</topic><topic>Velocity measurement</topic><topic>Voltage</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Jaeseok Jeon</creatorcontrib><creatorcontrib>Pott, Vincent</creatorcontrib><creatorcontrib>Hei Kam</creatorcontrib><creatorcontrib>Nathanael, Rhesa</creatorcontrib><creatorcontrib>Alon, Elad</creatorcontrib><creatorcontrib>Tsu-Jae King Liu</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library Online</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Mechanical &amp; Transportation Engineering Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Engineering Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology &amp; Engineering</collection><jtitle>Journal of microelectromechanical systems</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Jaeseok Jeon</au><au>Pott, Vincent</au><au>Hei Kam</au><au>Nathanael, Rhesa</au><au>Alon, Elad</au><au>Tsu-Jae King Liu</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Seesaw Relay Logic and Memory Circuits</atitle><jtitle>Journal of microelectromechanical systems</jtitle><stitle>JMEMS</stitle><date>2010-08-01</date><risdate>2010</risdate><volume>19</volume><issue>4</issue><spage>1012</spage><epage>1014</epage><pages>1012-1014</pages><issn>1057-7157</issn><eissn>1941-0158</eissn><coden>JMIYET</coden><abstract>Various logic functions can be implemented by appropriately biasing a single seesaw relay. The seesaw relay can also be configured as a bistable latch so that a memory cell can be implemented with one relay and one access transistor. Measurements of seesaw relay switching speed are well matched to lumped-parameter modeling results.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/JMEMS.2010.2049826</doi><tpages>3</tpages></addata></record>
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identifier ISSN: 1057-7157
ispartof Journal of microelectromechanical systems, 2010-08, Vol.19 (4), p.1012-1014
issn 1057-7157
1941-0158
language eng
recordid cdi_proquest_journals_1027782048
source IEEE Electronic Library (IEL) Journals
subjects Circuits
CMOS technology
Digital relays
Electrodes
Exact sciences and technology
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Integrated circuit measurements
Latches
Logic
Logic circuits
Logic functions
Mathematical models
Mechanical instruments, equipment and techniques
Microelectromechanical systems
Micromechanical devices and systems
Nanoelectromechanical systems
Physics
Relay
relay logic and memory circuits
Semiconductor devices
Switching
Transistors
Velocity measurement
Voltage
title Seesaw Relay Logic and Memory Circuits
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-21T14%3A37%3A05IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_pasca&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Seesaw%20Relay%20Logic%20and%20Memory%20Circuits&rft.jtitle=Journal%20of%20microelectromechanical%20systems&rft.au=Jaeseok%20Jeon&rft.date=2010-08-01&rft.volume=19&rft.issue=4&rft.spage=1012&rft.epage=1014&rft.pages=1012-1014&rft.issn=1057-7157&rft.eissn=1941-0158&rft.coden=JMIYET&rft_id=info:doi/10.1109/JMEMS.2010.2049826&rft_dat=%3Cproquest_pasca%3E787233874%3C/proquest_pasca%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c357t-e9fbfc9a71584903c446bc26025826ed05628c3d453229d58d2c137a29c6a8133%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=1027782048&rft_id=info:pmid/&rft_ieee_id=5471196&rfr_iscdi=true