CDM Simulation Based on Tester, Package and Full Integrated Circuit Modeling: Case Study

The electrostatic discharge (ESD) sensitivity of ICs with respect to the charged-device model (CDM) is strongly dependent on the IC package, the substrate resistivity, and the effectiveness of the ESD protection network. This paper presents a case study of predictive CDM circuit simulation method ba...

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Bibliographic Details
Published in:IEEE transactions on electron devices 2012-11, Vol.59 (11), p.2869-2875
Main Authors: Abessolo-Bidzo, D., Smedes, T., Huitsing, A. J.
Format: Article
Language:English
Subjects:
Applied sciences
Bipolar and complementary metal oxide semiconductor (BiCMOS) integrated circuits (ICs)
Capacitance
Circuits
Computer simulation
Design. Technologies. Operation analysis. Testing
Devices
Discharges (electric)
Electric, optical and optoelectronic circuits
Electrical resistivity
Electronics
electrostatic discharge (ESD)
Electrostatic discharges
Exact sciences and technology
Integrated circuit modeling
Integrated circuits
Logic gates
Mathematical models
Packages
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
SPICE simulations
Substrates
Testing, measurement, noise and reliability
Theoretical study. Circuits analysis and design
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Description
Summary:The electrostatic discharge (ESD) sensitivity of ICs with respect to the charged-device model (CDM) is strongly dependent on the IC package, the substrate resistivity, and the effectiveness of the ESD protection network. This paper presents a case study of predictive CDM circuit simulation method based on the tester, package, and full IC modeling approach.
ISSN:0018-9383
1557-9646
DOI:10.1109/TED.2012.2213173