Nuclear safeguards applications using LG-SIMS with automated screening capabilities

A primary tool for detecting undeclared nuclear activities is the analysis of uranium‐bearing particles collected on cotton swipes. For many years, secondary ion mass spectrometry (SIMS) has been used as one of the mainstay techniques for particle analysis of nuclear safeguards samples. SIMS is uniq...

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Published in:Surface and interface analysis 2013-01, Vol.45 (1), p.561-565
Main Authors: Peres, P., Hedberg, P. M. L., Walton, S., Montgomery, N., Cliff, J. B., Rabemananjara, F., Schuhmacher, M.
Format: Article
Language:English
Subjects:
Atomic, molecular, and ion beam impact and interactions with surfaces
CAMECA
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Electron and ion emission by liquids and solids
impact phenomena
Exact sciences and technology
Impact phenomena (including electron spectra and sputtering)
IMS 1280
ion microprobe
LG-SIMS
nuclear forensics
nuclear safeguards
particles
Physics
SIMS
uranium
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cited_by cdi_FETCH-LOGICAL-c3955-39484d21156057f9409f5f21096c2024c356938cb8408284f55d6a041643fc143
cites cdi_FETCH-LOGICAL-c3955-39484d21156057f9409f5f21096c2024c356938cb8408284f55d6a041643fc143
container_end_page 565
container_issue 1
container_start_page 561
container_title Surface and interface analysis
container_volume 45
creator Peres, P.
Hedberg, P. M. L.
Walton, S.
Montgomery, N.
Cliff, J. B.
Rabemananjara, F.
Schuhmacher, M.
description A primary tool for detecting undeclared nuclear activities is the analysis of uranium‐bearing particles collected on cotton swipes. For many years, secondary ion mass spectrometry (SIMS) has been used as one of the mainstay techniques for particle analysis of nuclear safeguards samples. SIMS is unique in that it is the only technique that can both localize the particles of interest and also provide the isotopic composition of single particles. This paper presents data obtained on standard uranium particle samples using large geometry (LG)‐SIMS instruments equipped with the newly developed, automated particle measurement screening software. Both sample screening measurements and microbeam analyses on individual particles are presented. The enhanced performance of the SIMS method for nuclear safeguards applications using LG‐SIMS instruments equipped with automated screening capabilities is also discussed. Copyright © 2012 John Wiley & Sons, Ltd. and Crown copyright
doi_str_mv 10.1002/sia.5015
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subjects Atomic, molecular, and ion beam impact and interactions with surfaces
CAMECA
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Electron and ion emission by liquids and solids
impact phenomena
Exact sciences and technology
Impact phenomena (including electron spectra and sputtering)
IMS 1280
ion microprobe
LG-SIMS
nuclear forensics
nuclear safeguards
particles
Physics
SIMS
uranium
title Nuclear safeguards applications using LG-SIMS with automated screening capabilities
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