Solid State Backscattered Electron Detector Optimized for Minimum Detectable Energy and Maximum Scan Speed

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

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Bibliographic Details
Published in:Microscopy and microanalysis 2011-07, Vol.17 (S2), p.904-905
Main Authors: Liebel, A, Soltau, H, Eckhardt, R, Jaritschin, O, Niculae, A, Schopper, F
Format: Article
Language:English
Subjects:
Instrumentation and Techniques
Optimizing Imaging for Microanalysis: Realizing the Benefits of the New Detector Options
Online Access:Get full text
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Description
Summary:Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927611005393