Three-Dimensional Characterization of Dental Bonded Interface Degradation Using Serial Ion-Ablation Scanning Electron Microscopy

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

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Bibliographic Details
Published in:Microscopy and microanalysis 2011-07, Vol.17 (S2), p.1016-1017
Main Authors: Duarte, S, Avishai, N, Avishai, A, Heuer, A, Phark, J
Format: Article
Language:English
Subjects:
Advances in 3D Electron Microscopy
Instrumentation and Techniques
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Description
Summary:Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927611005952