In-Situ Study of Nb Oxide Thin Films Using Electron Energy Loss Spectroscopy

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Saved in:
Bibliographic Details
Published in:Microscopy and microanalysis 2011-07, Vol.17 (S2), p.798-799
Main Authors: Tao, R, Klie, R, Romanenko, A, Cooley, L
Format: Article
Language:English
Subjects:
Advances in EELS and EFTEM
Energy
Energy loss
Instrumentation and Techniques
Oxidation
Point defects
Spectrum analysis
Thin films
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927611004867