New Results with Next Generation Solid State Backscattered Electron Detectors

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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Bibliographic Details
Published in:Microscopy and microanalysis 2012-07, Vol.18 (S2), p.1206-1207
Main Authors: Liebel, A., Soltau, H., Eckhardt, R., Jaritschin, O., Niculae, A., Schopper, F.
Format: Article
Language:English
Subjects:
Detectors, Correctors, and Analysis Methods-01
Efficiency
Geometry
Instrumentation Symposium
Sensors
Signal to noise ratio
Online Access:Get full text
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Description
Summary:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
ISSN:1431-9276
1435-8115
DOI:10.1017/S143192761200788X