Temperature dependence of Z-Contrast for InGaN

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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Bibliographic Details
Published in:Microscopy and microanalysis 2012-07, Vol.18 (S2), p.1818-1819
Main Authors: Mehrtens, T., Schowalter, M., Rosenauer, A., Tytko, D., Choi, P., Raabe, D., Hoffmann, L., Hangleiter, A.
Format: Article
Language:English
Subjects:
Indium
Microscopy
Microscopy and Analysis of Quantum Structures and Devices-02
Physical Science Symposium
Physics
Simulation
Temperature
Tomography
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Description
Summary:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
ISSN:1431-9276
1435-8115
DOI:10.1017/S143192761201094X