Combined plasma FIB-SEM

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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Bibliographic Details
Published in:Microscopy and microanalysis 2012-07, Vol.18 (S2), p.652-653
Main Authors: Jiruse, J., Hrncir, T., Lopour, F., Zadrazil, M., Delobe, A., Salord, O.
Format: Article
Language:English
Subjects:
Focused Ion Beam Instrumentation & Applications for Physical and Biological Sciences-05
Instrumentation Symposium
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Description
Summary:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927612005119