Confidence Intervals for Variance Components in Measurement System Capability Studies

In Measurement System Analysis a relevant issue is how to find confidence intervals for the parameters used to evaluate the capability of a gauge. In literature approximate solutions are available but they produce so wide intervals that they are often not effective in the decision process. In this a...

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Published in:Communications in statistics. Theory and methods 2012-08, Vol.41 (16-17), p.2932-2943
Main Authors: Deldossi, Laura, Zappa, Diego
Format: Article
Language:English
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62 K
Confidence coefficient
Confidence intervals
Generalized confidence interval
Modified large sample
Repeatability and reproducibility
Studies
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description In Measurement System Analysis a relevant issue is how to find confidence intervals for the parameters used to evaluate the capability of a gauge. In literature approximate solutions are available but they produce so wide intervals that they are often not effective in the decision process. In this article we introduce a new approach and, with particular reference to the parameter γ R , i.e., the ratio of the variance due to the process and the variance due to the instrument, we show that, under quite realistic assumptions, we obtain confidence intervals narrower than other methods. An application to a real microelectronic case study is reported.
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subjects 62 F
62 K
Confidence coefficient
Confidence intervals
Generalized confidence interval
Modified large sample
Repeatability and reproducibility
Studies
title Confidence Intervals for Variance Components in Measurement System Capability Studies
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