Loading…

Experience Patterns as Related To Vocational Preference

Saved in:

Bibliographic Details
Published in:	Educational and psychological measurement 1956-01, Vol.16 (2), p.223-231
Main Author:	Ewens, William Price
Format:	Article
Language:	English
Citations:	Items that this one cites Items that cite this one
Online Access:	Get full text
Tags:	Add Tag No Tags, Be the first to tag this record!

cited_by	cdi_FETCH-LOGICAL-c315t-c5c284f111a8583954e51d5bb752884397475177d37f1d5857cbd39482f3a0d53
cites	cdi_FETCH-LOGICAL-c315t-c5c284f111a8583954e51d5bb752884397475177d37f1d5857cbd39482f3a0d53
container_end_page	231
container_issue	2
container_start_page	223
container_title	Educational and psychological measurement
container_volume	16
creator	Ewens, William Price
description
doi_str_mv	10.1177/001316445601600206
format	article
fullrecord	<record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_1290203634</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sage_id>10.1177_001316445601600206</sage_id><sourcerecordid>1290203634</sourcerecordid><originalsourceid>FETCH-LOGICAL-c315t-c5c284f111a8583954e51d5bb752884397475177d37f1d5857cbd39482f3a0d53</originalsourceid><addsrcrecordid>eNp1kEFLxDAQhYMoWFf_gKeC57qZJNOkR1lWV1hwkdVrSdNUutS2JlnQf29KPQjiXAaG7z3mPUKugd4CSLmkFDjkQmBOIaeU0fyEJIDIMq6UOiXJBGQTcU4uvD_QOAIgIXL9OVrX2t7YdKdDsK73qfbps-10sHW6H9LXwejQDr3u0p2zjXUTfEnOGt15e_WzF-Tlfr1fbbLt08Pj6m6bGQ4YMoOGKdEAgFaoeIHCItRYVRKZUoIXUkiMAWoum3hXKE1V80Io1nBNa-QLcjP7jm74OFofysNwdPEXXwIrYlCecxEpNlPGDd7HJ8vRte_afZVAy6mg8m9BUbScRV6_2V-2_yu-Ad7TYnE</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1290203634</pqid></control><display><type>article</type><title>Experience Patterns as Related To Vocational Preference</title><source>SAGE Complete Deep Backfile Purchase 2012</source><creator>Ewens, William Price</creator><creatorcontrib>Ewens, William Price</creatorcontrib><identifier>ISSN: 0013-1644</identifier><identifier>EISSN: 1552-3888</identifier><identifier>DOI: 10.1177/001316445601600206</identifier><language>eng</language><publisher>Thousand Oaks, CA: SAGE Publications</publisher><ispartof>Educational and psychological measurement, 1956-01, Vol.16 (2), p.223-231</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c315t-c5c284f111a8583954e51d5bb752884397475177d37f1d5857cbd39482f3a0d53</citedby><cites>FETCH-LOGICAL-c315t-c5c284f111a8583954e51d5bb752884397475177d37f1d5857cbd39482f3a0d53</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://journals.sagepub.com/doi/pdf/10.1177/001316445601600206$$EPDF$$P50$$Gsage$$H</linktopdf><linktohtml>$$Uhttps://journals.sagepub.com/doi/10.1177/001316445601600206$$EHTML$$P50$$Gsage$$H</linktohtml><link.rule.ids>314,780,784,21845,27924,27925,45082,45470</link.rule.ids></links><search><creatorcontrib>Ewens, William Price</creatorcontrib><title>Experience Patterns as Related To Vocational Preference</title><title>Educational and psychological measurement</title><issn>0013-1644</issn><issn>1552-3888</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1956</creationdate><recordtype>article</recordtype><recordid>eNp1kEFLxDAQhYMoWFf_gKeC57qZJNOkR1lWV1hwkdVrSdNUutS2JlnQf29KPQjiXAaG7z3mPUKugd4CSLmkFDjkQmBOIaeU0fyEJIDIMq6UOiXJBGQTcU4uvD_QOAIgIXL9OVrX2t7YdKdDsK73qfbps-10sHW6H9LXwejQDr3u0p2zjXUTfEnOGt15e_WzF-Tlfr1fbbLt08Pj6m6bGQ4YMoOGKdEAgFaoeIHCItRYVRKZUoIXUkiMAWoum3hXKE1V80Io1nBNa-QLcjP7jm74OFofysNwdPEXXwIrYlCecxEpNlPGDd7HJ8vRte_afZVAy6mg8m9BUbScRV6_2V-2_yu-Ad7TYnE</recordid><startdate>19560101</startdate><enddate>19560101</enddate><creator>Ewens, William Price</creator><general>SAGE Publications</general><general>Educational and Psychological Measurement, etc</general><scope>AAYXX</scope><scope>CITATION</scope><scope>EOLOZ</scope><scope>FKUCP</scope><scope>IOIBA</scope><scope>K30</scope><scope>PAAUG</scope><scope>PAWHS</scope><scope>PAWZZ</scope><scope>PAXOH</scope><scope>PBHAV</scope><scope>PBQSW</scope><scope>PBYQZ</scope><scope>PCIWU</scope><scope>PCMID</scope><scope>PCZJX</scope><scope>PDGRG</scope><scope>PDWWI</scope><scope>PETMR</scope><scope>PFVGT</scope><scope>PGXDX</scope><scope>PIHIL</scope><scope>PISVA</scope><scope>PJCTQ</scope><scope>PJTMS</scope><scope>PLCHJ</scope><scope>PMHAD</scope><scope>PNQDJ</scope><scope>POUND</scope><scope>PPLAD</scope><scope>PQAPC</scope><scope>PQCAN</scope><scope>PQCMW</scope><scope>PQEME</scope><scope>PQHKH</scope><scope>PQMID</scope><scope>PQNCT</scope><scope>PQNET</scope><scope>PQSCT</scope><scope>PQSET</scope><scope>PSVJG</scope><scope>PVMQY</scope><scope>PZGFC</scope></search><sort><creationdate>19560101</creationdate><title>Experience Patterns as Related To Vocational Preference</title><author>Ewens, William Price</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c315t-c5c284f111a8583954e51d5bb752884397475177d37f1d5857cbd39482f3a0d53</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1956</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Ewens, William Price</creatorcontrib><collection>CrossRef</collection><collection>Periodicals Index Online Segment 01</collection><collection>Periodicals Index Online Segment 04</collection><collection>Periodicals Index Online Segment 29</collection><collection>Periodicals Index Online</collection><collection>Primary Sources Access—Foundation Edition (Plan E) - West</collection><collection>Primary Sources Access (Plan D) - International</collection><collection>Primary Sources Access & Build (Plan A) - MEA</collection><collection>Primary Sources Access—Foundation Edition (Plan E) - Midwest</collection><collection>Primary Sources Access—Foundation Edition (Plan E) - Northeast</collection><collection>Primary Sources Access (Plan D) - Southeast</collection><collection>Primary Sources Access (Plan D) - North Central</collection><collection>Primary Sources Access—Foundation Edition (Plan E) - Southeast</collection><collection>Primary Sources Access (Plan D) - South Central</collection><collection>Primary Sources Access & Build (Plan A) - UK / I</collection><collection>Primary Sources Access (Plan D) - Canada</collection><collection>Primary Sources Access (Plan D) - EMEALA</collection><collection>Primary Sources Access—Foundation Edition (Plan E) - North Central</collection><collection>Primary Sources Access—Foundation Edition (Plan E) - South Central</collection><collection>Primary Sources Access & Build (Plan A) - International</collection><collection>Primary Sources Access—Foundation Edition (Plan E) - International</collection><collection>Primary Sources Access (Plan D) - West</collection><collection>Periodicals Index Online Segments 1-50</collection><collection>Primary Sources Access (Plan D) - APAC</collection><collection>Primary Sources Access (Plan D) - Midwest</collection><collection>Primary Sources Access (Plan D) - MEA</collection><collection>Primary Sources Access—Foundation Edition (Plan E) - Canada</collection><collection>Primary Sources Access—Foundation Edition (Plan E) - UK / I</collection><collection>Primary Sources Access—Foundation Edition (Plan E) - EMEALA</collection><collection>Primary Sources Access & Build (Plan A) - APAC</collection><collection>Primary Sources Access & Build (Plan A) - Canada</collection><collection>Primary Sources Access & Build (Plan A) - West</collection><collection>Primary Sources Access & Build (Plan A) - EMEALA</collection><collection>Primary Sources Access (Plan D) - Northeast</collection><collection>Primary Sources Access & Build (Plan A) - Midwest</collection><collection>Primary Sources Access & Build (Plan A) - North Central</collection><collection>Primary Sources Access & Build (Plan A) - Northeast</collection><collection>Primary Sources Access & Build (Plan A) - South Central</collection><collection>Primary Sources Access & Build (Plan A) - Southeast</collection><collection>Primary Sources Access (Plan D) - UK / I</collection><collection>Primary Sources Access—Foundation Edition (Plan E) - APAC</collection><collection>Primary Sources Access—Foundation Edition (Plan E) - MEA</collection><jtitle>Educational and psychological measurement</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Ewens, William Price</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Experience Patterns as Related To Vocational Preference</atitle><jtitle>Educational and psychological measurement</jtitle><date>1956-01-01</date><risdate>1956</risdate><volume>16</volume><issue>2</issue><spage>223</spage><epage>231</epage><pages>223-231</pages><issn>0013-1644</issn><eissn>1552-3888</eissn><cop>Thousand Oaks, CA</cop><pub>SAGE Publications</pub><doi>10.1177/001316445601600206</doi><tpages>9</tpages></addata></record>
fulltext	fulltext
identifier	ISSN: 0013-1644
ispartof	Educational and psychological measurement, 1956-01, Vol.16 (2), p.223-231
issn	0013-1644 1552-3888
language	eng
recordid	cdi_proquest_journals_1290203634
source	SAGE Complete Deep Backfile Purchase 2012
title	Experience Patterns as Related To Vocational Preference
url	http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T15%3A43%3A51IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Experience%20Patterns%20as%20Related%20To%20Vocational%20Preference&rft.jtitle=Educational%20and%20psychological%20measurement&rft.au=Ewens,%20William%20Price&rft.date=1956-01-01&rft.volume=16&rft.issue=2&rft.spage=223&rft.epage=231&rft.pages=223-231&rft.issn=0013-1644&rft.eissn=1552-3888&rft_id=info:doi/10.1177/001316445601600206&rft_dat=%3Cproquest_cross%3E1290203634%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c315t-c5c284f111a8583954e51d5bb752884397475177d37f1d5857cbd39482f3a0d53%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=1290203634&rft_id=info:pmid/&rft_sage_id=10.1177_001316445601600206&rfr_iscdi=true