Thermal Expansion of CeO2, Ho2O3, and Lu2O3 from 100° to 300°K by an X-Ray Method

Thermal expansion of CeO2, Ho2O8, and Lu2O3 was determined from 100° to 300°K by a back‐reflection X‐ray technique. The variation of thermal expansion with temperature is the same as that of specific heat for CeO2 and Ho2O3; these oxides obey the Grueneisen model of thermal expansion in the temperat...

Full description

Saved in:
Bibliographic Details
Published in:Journal of the American Ceramic Society 1970-12, Vol.53 (12), p.663-665
Main Authors: GUPTA, MURARI L., SINGH, SOHAN
Format: Article
Language:English
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Thermal expansion of CeO2, Ho2O8, and Lu2O3 was determined from 100° to 300°K by a back‐reflection X‐ray technique. The variation of thermal expansion with temperature is the same as that of specific heat for CeO2 and Ho2O3; these oxides obey the Grueneisen model of thermal expansion in the temperature range studied.
ISSN:0002-7820
1551-2916
DOI:10.1111/j.1151-2916.1970.tb12037.x