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Evaluation of two-dimensional electrical properties of photovoltaic modules using bias-dependent electroluminescence
ABSTRACT An approach to deriving two‐dimensional maps of cell and module electrical properties from electroluminescence imaging is presented. The technique involves quantitative comparison of the intensity differences in the electroluminescence images at different bias currents, enabling the derivat...
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Published in: | Progress in photovoltaics 2012-12, Vol.20 (8), p.936-944 |
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Main Authors: | , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | ABSTRACT
An approach to deriving two‐dimensional maps of cell and module electrical properties from electroluminescence imaging is presented. The technique involves quantitative comparison of the intensity differences in the electroluminescence images at different bias currents, enabling the derivation of junction voltages of individual pixels. These data were then fitted to a distributed electrical model that allows the derivation of a two‐dimensional dark I–V curve for each point across the module. Interpretation of the dark I–V curve enabled the evaluation of series resistance, shunt resistance, ideality factor, and reverse saturation current for each pixel. These parameters were then used to enable the prediction of module performance under illumination. Copyright © 2011 John Wiley & Sons, Ltd.
An approach is presented for evaluating a 2‐dimensional (2‐D) map of electrical properties across a photovoltaic module using electroluminesence. The approach is equivalent to generating a 2‐D map of dark I‐V curves for each pixel across the module. The electrical properties thus derived can be substituted into the solution of the light I‐V equation to enable the performance of individual pixels to be predicted under illumination. |
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ISSN: | 1062-7995 1099-159X |
DOI: | 10.1002/pip.1161 |