Atomic Resolution Analysis of Microporous Titanosilicate ETS-10 through Aberration Corrected STEM Imaging

It′s all your fault! Microporous titanosilicate ETS‐10 crystals have been analyzed by advanced electron microscopy techniques. With the last generation of spherical aberration corrected electron microscopes, truly atomic resolution images have been recorded. Owing to the extremely high‐resolution im...

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Bibliographic Details
Published in:ChemCatChem 2013-09, Vol.5 (9), p.2595-2598
Main Authors: Mayoral, Alvaro, Coronas, Joaquin, Casado, Clara, Tellez, Carlos, Díaz, Isabel
Format: Article
Language:English
Subjects:
catalysis
electron microscopy
molecular sieves
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Summary:It′s all your fault! Microporous titanosilicate ETS‐10 crystals have been analyzed by advanced electron microscopy techniques. With the last generation of spherical aberration corrected electron microscopes, truly atomic resolution images have been recorded. Owing to the extremely high‐resolution images that have been obtained, the multiple defects (stacking faults, lack of porosity and “double‐pores”) present in this type of material can be analyzed in great detail.
ISSN:1867-3880
1867-3899
DOI:10.1002/cctc.201300045