Trace Elemental Analysis of Illicit Methamphetamines Using Total Reflection X-Ray Fluorescence Spectroscopy

• Published in: Journal of Health Science 1999/06/30, Vol.45(3), pp.166-171
• Main Authors: Muratsu, Seiji, Fukui, Sadao, Maeda, Toyonaga, Matsushita, Tohru, Hasegawa, Hiromu, Sakurai, Yukihiro, Shimoda, Osamu, Kaizaki, Sumio, Ninomiya, Toshio
• Format: Article
• Language: eng ; jpn
• Subjects: trace elemental analysis
• ISSN: 1344-9702; 1347-5207
• DOI: 10.1248/jhs.45.166

Total reflection X-ray fluorescence spectroscopy (TXRF) was applied to trace elemental analysis of 50 kinds of seized methamphetamines, a half of which had been classified to be pure and the remainder to be impure. As trace elements, Br, Hg, I, Ca, Fe, Cr, Mn, Ni, Cu and Zn were detected. Among them, Br was detected in all samples and its content was distributed between 0.4ng and 71ng per 1mg of methamphetamine HCl and Hg was detected in 8 samples and its content was distributed between 0.8ng and 9ng per 1mg of methamphetamine HCl. Iodine was detected in 8 samples, among which 6 samples also contained Hg. Hg and I were presumed to be derived from synthetic reagents. Iron and other heavy metals would be derived from impurities in synthetic solvents or metal containers through synthetic or smuggling processes. Elements detected in seized methamphetamines are applicable as tracing markers for the ascertainment of clandestine synthetic techniques or places to make illicit methamphetamine salts.