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Negative Electron Beam Resists Using Ring-Chain Tautomerism of Benzoic Acid Derivatives
New negative electron-beam (EB) resists based on ring-chain tautomerism of benzoic acid derivatives have been developed. o-Acetylbenzoic acid (ABA), which converts into the ring-tautomer through a hydrogen transfer from the carboxyl group to the carbonyl group, was selected as the precursor of disso...
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Published in: | Journal of Photopolymer Science and Technology 1999, Vol.12(2), pp.359-364 |
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container_end_page | 364 |
container_issue | 2 |
container_start_page | 359 |
container_title | Journal of Photopolymer Science and Technology |
container_volume | 12 |
creator | Uchino, Shou-ichi Kimura, Kaori |
description | New negative electron-beam (EB) resists based on ring-chain tautomerism of benzoic acid derivatives have been developed. o-Acetylbenzoic acid (ABA), which converts into the ring-tautomer through a hydrogen transfer from the carboxyl group to the carbonyl group, was selected as the precursor of dissolution inhibitor for the new resist. The resist composed of ABA, diphenyliodonium triflate, and m, p-cresol novolak resin enables us to define 300-nm line and 500-nm space patterns with a dose of 75μC/cm2 at 70kV. Spectroscopic studies show that the acid-catalyzed protection of hydroxyl groups of novolak resin brought about by ABA is responsible for the resist insolubilization. |
doi_str_mv | 10.2494/photopolymer.12.359 |
format | article |
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The resist composed of ABA, diphenyliodonium triflate, and m, p-cresol novolak resin enables us to define 300-nm line and 500-nm space patterns with a dose of 75μC/cm2 at 70kV. Spectroscopic studies show that the acid-catalyzed protection of hydroxyl groups of novolak resin brought about by ABA is responsible for the resist insolubilization.</description><identifier>ISSN: 0914-9244</identifier><identifier>EISSN: 1349-6336</identifier><identifier>DOI: 10.2494/photopolymer.12.359</identifier><language>eng</language><publisher>Hiratsuka: The Society of Photopolymer Science and Technology(SPST)</publisher><subject>electron beam ; novolak resin ; o-acetylbenzoic acid ; resist ; ring-chain tautomerism</subject><ispartof>Journal of Photopolymer Science and Technology, 1999, Vol.12(2), pp.359-364</ispartof><rights>The Technical Association of Photopolymers, Japan</rights><rights>Copyright Japan Science and Technology Agency 1999</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,4010,27902,27903,27904</link.rule.ids></links><search><creatorcontrib>Uchino, Shou-ichi</creatorcontrib><creatorcontrib>Kimura, Kaori</creatorcontrib><title>Negative Electron Beam Resists Using Ring-Chain Tautomerism of Benzoic Acid Derivatives</title><title>Journal of Photopolymer Science and Technology</title><addtitle>J. Photopol. Sci. Technol.</addtitle><description>New negative electron-beam (EB) resists based on ring-chain tautomerism of benzoic acid derivatives have been developed. o-Acetylbenzoic acid (ABA), which converts into the ring-tautomer through a hydrogen transfer from the carboxyl group to the carbonyl group, was selected as the precursor of dissolution inhibitor for the new resist. The resist composed of ABA, diphenyliodonium triflate, and m, p-cresol novolak resin enables us to define 300-nm line and 500-nm space patterns with a dose of 75μC/cm2 at 70kV. Spectroscopic studies show that the acid-catalyzed protection of hydroxyl groups of novolak resin brought about by ABA is responsible for the resist insolubilization.</description><subject>electron beam</subject><subject>novolak resin</subject><subject>o-acetylbenzoic acid</subject><subject>resist</subject><subject>ring-chain tautomerism</subject><issn>0914-9244</issn><issn>1349-6336</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1999</creationdate><recordtype>article</recordtype><recordid>eNpVkE1LAzEQhoMoWKu_wEvA89Z8b3OstX5AUSgtHkOazbYp282abAv115u6UvQyA8PzzAwvALcYDQiT7L5Z-9Y3vjpsbRhgMqBcnoEepkxmglJxDnpIYpZJwtgluIpxgxClnMse-HizK926vYWTypo2-Bo-WL2FMxtdbCNcRFev4CyVbLzWroZzvWt9OuPiFvoywfWXdwaOjCvgYxrvf7bFa3BR6iram9_eB4unyXz8kk3fn1_Ho2lmGDp-RwwXhtKcG2oI0pibwghUyiLXDBOaG53eZMtc5EvNC0QNZswgKQTGS8EJ7YO7bm8T_OfOxlZt_C7U6aRKJBOYSk4TRTvKBB9jsKVqgtvqcFAYqWOC6m-CChOVEkzWtLM2sdUre3J0aJ2p7D8Hy-Hw6JGuJP2EmbUOytb0G1Vlgy8</recordid><startdate>1999</startdate><enddate>1999</enddate><creator>Uchino, Shou-ichi</creator><creator>Kimura, Kaori</creator><general>The Society of Photopolymer Science and Technology(SPST)</general><general>Japan Science and Technology Agency</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7SR</scope><scope>7U5</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>1999</creationdate><title>Negative Electron Beam Resists Using Ring-Chain Tautomerism of Benzoic Acid Derivatives</title><author>Uchino, Shou-ichi ; Kimura, Kaori</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c4049-62c56c3375c3c20a15cdc60f9d7a41237ca5594b767ba5d03c144c096611b6523</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1999</creationdate><topic>electron beam</topic><topic>novolak resin</topic><topic>o-acetylbenzoic acid</topic><topic>resist</topic><topic>ring-chain tautomerism</topic><toplevel>online_resources</toplevel><creatorcontrib>Uchino, Shou-ichi</creatorcontrib><creatorcontrib>Kimura, Kaori</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of Photopolymer Science and Technology</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Uchino, Shou-ichi</au><au>Kimura, Kaori</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Negative Electron Beam Resists Using Ring-Chain Tautomerism of Benzoic Acid Derivatives</atitle><jtitle>Journal of Photopolymer Science and Technology</jtitle><addtitle>J. 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Spectroscopic studies show that the acid-catalyzed protection of hydroxyl groups of novolak resin brought about by ABA is responsible for the resist insolubilization.</abstract><cop>Hiratsuka</cop><pub>The Society of Photopolymer Science and Technology(SPST)</pub><doi>10.2494/photopolymer.12.359</doi><tpages>6</tpages><oa>free_for_read</oa></addata></record> |
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subjects | electron beam novolak resin o-acetylbenzoic acid resist ring-chain tautomerism |
title | Negative Electron Beam Resists Using Ring-Chain Tautomerism of Benzoic Acid Derivatives |
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