Ion-selective Imaging by Atomic Force Microscopy with a Crown-ether-modified Tip

Ion-selective surface imaging was successfully attained by atomic force microscopy with a probe tip functionalized with a 15-crown-5 derivative. The frictional force images for nanopatterned substrates revealed enhanced contrasts attributable to the cation-binding interaction between the 15-crown-5...

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Published in:Chemistry letters 2009-01, Vol.38 (1), p.58-59
Main Authors: Kado, Shinpei, Yano, Hitoshi, Nakahara, Yoshio, Kimura, Keiichi
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Language:English
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creator Kado, Shinpei
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Kimura, Keiichi
description Ion-selective surface imaging was successfully attained by atomic force microscopy with a probe tip functionalized with a 15-crown-5 derivative. The frictional force images for nanopatterned substrates revealed enhanced contrasts attributable to the cation-binding interaction between the 15-crown-5 on the tip and potassium ions on the substrate.
doi_str_mv 10.1246/cl.2009.58
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title Ion-selective Imaging by Atomic Force Microscopy with a Crown-ether-modified Tip
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