Direct Observations of Retention Failure in Ferroelectric Memories by in situ Transmission Electron Microscopy

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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Bibliographic Details
Published in:Microscopy and microanalysis 2012-07, Vol.18 (S2), p.1846-1847
Main Authors: Gao, P., Nelson, C., Jokisaari, J., Zhang, Y., Pan, X., Baek, S., Bark, C., Eom, C.
Format: Article
Language:English
Subjects:
Ferroelectrics
Microscopy and Analysis of Quantum Structures and Devices-05
Physical Science Symposium
Online Access:Get full text
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Description
Summary:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927612011087