Advanced technologies for charge mitigation on non conductive samples

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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Bibliographic Details
Published in:Microscopy and microanalysis 2012-07, Vol.18 (S2), p.1284-1285
Main Authors: Wall, D.C., Bosch, E., Sluyterman, S., Wandrol, P.
Format: Article
Language:English
Subjects:
Instrumentation Symposium
Vendor Symposium-01
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Description
Summary:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927612008276