Enhanced Surface and In-Depth Characterization of Organic and Inorganic Materials Using XPS and Soft Depth Profiling with Argon Cluster Ion Beams

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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Bibliographic Details
Published in:Microscopy and microanalysis 2012-07, Vol.18 (S2), p.918-919
Main Authors: Strohmeier, B.R., White, R.G., Nunney, T.S., Mack, P., Wright, A.E.
Format: Article
Language:English
Subjects:
Instrumentation Symposium
Surface and Subsurface Analysis-08
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Description
Summary:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927612006447