New Weighted Time Lag Method for the Analysis of Random Telegraph Signals

A new method for the characterization of random telegraph signals (RTSs) is presented. The method, which is based on the time lag plot, is illustrated using Monte Carlo generated RTS traces and applied to identify the contribution of defects in multilevel RTS measured in a pMOS transistor. The resul...

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Bibliographic Details
Published in:IEEE electron device letters 2014-04, Vol.35 (4), p.479-481
Main Authors: Martin-Martinez, Javier, Diaz, Javier, Rodriguez, Rosana, Nafria, Montserrat, Aymerich, Xavier
Format: Article
Language:English
Subjects:
Applied sciences
characterization
CMOS
Design. Technologies. Operation analysis. Testing
Electronics
Exact sciences and technology
Histograms
Integrated circuits
Monte Carlo methods
MOSFET
Noise
Noise measurement
Parameter extraction
Random telegraph signals
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Transistors
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Summary:A new method for the characterization of random telegraph signals (RTSs) is presented. The method, which is based on the time lag plot, is illustrated using Monte Carlo generated RTS traces and applied to identify the contribution of defects in multilevel RTS measured in a pMOS transistor. The results show that the new method provides a powerful and easily implementable technique to obtain the parameters of the defects responsible of multilevel RTS, even when the background noise is relevant.
ISSN:0741-3106
1558-0563
DOI:10.1109/LED.2014.2304673