Kinetic Analysis of Spontaneous Whisker Growth on Pre-treated Surfaces with Weak Oxide

This study sought to clarify the relationship between cracks in surface oxide layers and the growth behavior of tin whiskers. The number, length, and total volume of extrusions were precisely calculated and residual stress was measured using synchrotron radiation x-ray diffractometry. The aim was to...

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Bibliographic Details
Published in:Journal of electronic materials 2014-09, Vol.43 (9), p.3290-3295
Main Authors: Su, Chien-Hao, Chen, Hao, Lee, Hsin-Yi, Liu, Cheng Yi, Ku, Ching-Shun, Wu, Albert T.
Format: Article
Language:English
Subjects:
Applied sciences
Ceramic whiskers
Characterization and Evaluation of Materials
Chemistry and Materials Science
Condensed matter: structure, mechanical and thermal properties
Corrosion
Corrosion mechanisms
Cross-disciplinary physics: materials science
rheology
Diffusion
Diffusion in solids
Electronics and Microelectronics
Exact sciences and technology
Instrumentation
Intermetallic compounds
Materials Science
Metals. Metallurgy
Methods of crystal growth
physics of crystal growth
Optical and Electronic Materials
Oxidation
Physics
Radiation
Solid State Physics
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Theory and models of crystal growth
physics of crystal growth, crystal morphology and orientation
Thin films
Transport properties of condensed matter (nonelectronic)
Whiskers and dendrites (growth, structure, and nonelectronic properties)
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Description
Summary:This study sought to clarify the relationship between cracks in surface oxide layers and the growth behavior of tin whiskers. The number, length, and total volume of extrusions were precisely calculated and residual stress was measured using synchrotron radiation x-ray diffractometry. The aim was to elucidate the influence of stress on the driving force and flux involved in atomic diffusion. The distance between weak spots was shown to be the most significant factor involved in the growth of whiskers. The results could explain why increasing the density of the surface weak spots could reduce the number of long whiskers. Measuring the dimensions of whiskers yielded a precise kinetic model capable of describing the migration of atoms to the root of whiskers, resulting in their spontaneous growth.
ISSN:0361-5235
1543-186X
DOI:10.1007/s11664-014-3182-6