Evaluation of RF micro-discharge regimes in performance of evanescent-mode cavity resonators

• Published in: Electronics letters 2014-08, Vol.50 (17), p.1244-1246
• Main Authors: Semnani, A, Peroulis, D
• Format: Article
• Language: English
• Subjects: Applied classical electromagnetism; Boundaries; Cavity resonators; Constraining; Diffusion; diffusion‐controlled regimes; electromagnetic simulations; Electromagnetic wave propagation, radiowave propagation; Electromagnetism; electron and ion optics; evanescent‐mode cavity resonators; Exact sciences and technology; frequency 1 GHz; frequency 50 GHz; Fundamental areas of phenomenology (including applications); Gas breakdown; heavily loaded cavity‐based resonators; high power gas breakdown; high‐frequency discharges; microscopic plasma parameters; microwave resonators; Physics; plasma simulations; Resonators; RF boundary; RF gas breakdown; RF microdischarge evaluation; Sensitivity analysis; Simulation; size 19 mum; UHF resonators; Wireless communications
• ISSN: 0013-5194; 1350-911X; 1350-911X
• DOI: 10.1049/el.2014.1790

RF gas breakdown in small gaps is a primary limiting factor in the power handling of heavily loaded cavity-based resonators. The effects of different RF micro-discharge regimes in the performance of these resonators are studied. Specifically, two resonators at 1 and 50 GHz with the same critical gap size of 19 μm which are, respectively, working in the RF boundary and diffusion-controlled regimes are considered. By combining plasma and electromagnetic simulations, the effects of high power gas breakdown in the performance of these resonators are compared. A sensitivity analysis on the effects of microscopic plasma parameters is also performed.