Lattice and Grain-Boundary Diffusion of Al in Tetragonal Yttria-Stabilized Zirconia Polycrystalline Ceramics (3Y-TZP) Analyzed Using SIMS

Aluminum oxide was deposited on the surface of 3 mol% yttria‐stabilized tetragonal zirconia polycrystals (3Y‐TZP). The samples were annealed at temperatures from 1523 to 1773 K. Diffusion profiles of Al in the form of mean concentration vs. depth in B‐type kinetic region were investigated by seconda...

Full description

Saved in:
Bibliographic Details
Published in:Journal of the American Ceramic Society 2014-10, Vol.97 (10), p.3122-3127
Main Authors: Kowalski, Kazimierz, Obal, Katarzyna, Pedzich, Zbigniew, Schneider, Krystyna, Rekas, Mieczyslaw
Format: Article
Language:English
Subjects:
Annealing
Ceramics
Diffusion
Grain boundaries
Mass spectrometry
Temperature effects
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Aluminum oxide was deposited on the surface of 3 mol% yttria‐stabilized tetragonal zirconia polycrystals (3Y‐TZP). The samples were annealed at temperatures from 1523 to 1773 K. Diffusion profiles of Al in the form of mean concentration vs. depth in B‐type kinetic region were investigated by secondary ion mass spectroscopy. The experimental results for the lattice diffusion (DB) and grain boundary diffusion (DGB) are as follows: DB=6.5×105exp−590kJmolRT[cm2s] and DGBδs=2.6×105exp−675kJmolRT[cm3s]where δ is the grain‐boundary width and s is the segregation factor.
ISSN:0002-7820
1551-2916
DOI:10.1111/jace.13126