The Role of Feedback Resistors and TID Effects in the ASET Response of a High Speed Current Feedback Amplifier

The influence of external circuit designs on ASET shapes in a high speed current feedback amplifier (CFA) (AD844) is investigated by means of the pulsed laser single event effect (PLSEE) simulation technique. Changes of the feedback resistors modify circuit's electrical parameters such as close...

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Bibliographic Details
Published in:IEEE transactions on nuclear science 2014-12, Vol.61 (6), p.3201-3209
Main Authors: Roig, Fabien, Dusseau, L., Ribeiro, P., Auriel, G., Roche, N. J.-H, Privat, A., Vaille, J.-R, Boch, J., Saigne, F., Marec, R., Calvel, P., Bezerra, F., Ecoffet, R., Azais, B.
Format: Article
Language:English
Subjects:
Bipolar analog integrated circuits
Bipolar integrated circuits
Electronics
Engineering Sciences
Feedback amplifiers
ionizing dose
Ionizing radiation
Resistors
single event transient
Single event transients
Transient analysis
Transient response
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Summary:The influence of external circuit designs on ASET shapes in a high speed current feedback amplifier (CFA) (AD844) is investigated by means of the pulsed laser single event effect (PLSEE) simulation technique. Changes of the feedback resistors modify circuit's electrical parameters such as closed-loop gain and bandwidth, affecting amplifier stability and so ASET shapes. Qualitative explanations based on general electronic rules and feedback theories enable the understanding of a CFA operation establishing a correlation between the evolution of external feedback resistor values and ASET parameters. TID effects on the ASET sensitivity in AD844 CFA are also investigated in this work highlighting different behaviors according to the impacted bipolar transistor in the integrated circuit.
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2014.2369347