Atomic Force Microscopy Techniques for Nanomechanical Characterization: A Polymeric Case Study

Atomic force microscopy (AFM) is a versatile tool to perform mechanical characterization of surface samples at the nanoscale. In this work, we review two of such methods, namely contact resonance AFM (CR-AFM) and torsional harmonics AFM (TH-AFM). First, such techniques are illustrated and their appl...

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Bibliographic Details
Published in:JOM (1989) 2015-04, Vol.67 (4), p.849-857
Main Authors: Reggente, Melania, Rossi, Marco, Angeloni, Livia, Tamburri, Emanuela, Lucci, Massimiliano, Davoli, Ivan, Terranova, Maria Letizia, Passeri, Daniele
Format: Article
Language:English
Subjects:
Atomic physics
Case studies
Chemistry/Food Science
Earth Sciences
Engineering
Environment
Fourier transforms
Mechanical properties
Microscopes
Microscopy
Nanostructured materials
Physics
Polymer blends
Polymers
Signal to noise ratio
Studies
Thin films
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Summary:Atomic force microscopy (AFM) is a versatile tool to perform mechanical characterization of surface samples at the nanoscale. In this work, we review two of such methods, namely contact resonance AFM (CR-AFM) and torsional harmonics AFM (TH-AFM). First, such techniques are illustrated and their applicability on materials with elastic moduli in different ranges are discussed, together with their main advantages and limitations. Then, a case study is presented in which we report the mechanical characterization using both CR-AFM and TH-AFM of polyaniline and polyaniniline doped with nanodiamond particles tablets prepared by a pressing process. We determined the indentation modulus values of their surfaces, which were found in fairly good agreement, thus demonstrating the accuracy of the techniques. Finally, the determined surface elastic moduli have been compared with the bulk ones measured through standard indentation testing.
ISSN:1047-4838
1543-1851
DOI:10.1007/s11837-015-1340-9