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X-ray diffraction method for determination of interplanar spacing and temperature distribution in crystals under an external temperature gradient
An X‐ray diffraction method is developed for the determination of the distribution of temperature and interplanar spacing in a single‐crystal plate. In particular, the temperature and the interplanar spacing differences in two different parts of a quartz single crystal of X‐cut are experimentally de...
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| Published in: | Journal of applied crystallography 2015-06, Vol.48 (3), p.853-856 |
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| Main Authors: | , , , , , |
| Format: | Article |
| Language: | English |
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| cited_by | cdi_FETCH-LOGICAL-c3613-1b6a899ebc0fcac4eb9e1a154055c6229325cea8e34747739fd85970c7c006353 |
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| cites | cdi_FETCH-LOGICAL-c3613-1b6a899ebc0fcac4eb9e1a154055c6229325cea8e34747739fd85970c7c006353 |
| container_end_page | 856 |
| container_issue | 3 |
| container_start_page | 853 |
| container_title | Journal of applied crystallography |
| container_volume | 48 |
| creator | Kocharyan, V. R. Gogolev, A. S. Movsisyan, A. E. Beybutyan, A. H. Khlopuzyan, S. G. Aloyan, L. R. |
| description | An X‐ray diffraction method is developed for the determination of the distribution of temperature and interplanar spacing in a single‐crystal plate. In particular, the temperature and the interplanar spacing differences in two different parts of a quartz single crystal of X‐cut are experimentally determined depending on the value of the temperature gradient applied perpendicularly to the reflecting atomic planes (). The temperature distribution along the direction perpendicular to the reflecting atomic planes () and the interplanar spacing distribution of atomic planes () are determined as well. |
| doi_str_mv | 10.1107/S1600576715006913 |
| format | article |
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The temperature distribution along the direction perpendicular to the reflecting atomic planes () and the interplanar spacing distribution of atomic planes () are determined as well.</description><subject>Crystals</subject><subject>Diffraction</subject><subject>external temperature gradients</subject><subject>interplanar spacing</subject><subject>Temperature</subject><subject>temperature distribution</subject><subject>X-ray diffraction</subject><issn>1600-5767</issn><issn>0021-8898</issn><issn>1600-5767</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2015</creationdate><recordtype>article</recordtype><recordid>eNqFkEFv1DAQhSMEEqXlB3CzxDlgx7G9PqIVdEGlldqt4GbNOpPisuuEsaN2fwb_GKeLEBUHTjN6876n0auqV4K_EYKbt1dCc66MNkJxrq2QT6qjWapn7elf-_PqRUq3nAttmuao-vm1JtizLvQ9gc9hiGyH-dvQsX4g1mFG2oUID4ehZyEWYdxCBGJpBB_iDYPYsYy7EQnyRFiyUqawmR6YEJmnfcqwTWyKHVKxM7wvKRG2j7Abgi5gzCfVs7648eXveVxdf3i_Xq7qs4vTj8t3Z7WXWshabDQsrMWN570H3-LGogChWq6U101jZaM8wgJla1pjpO27hbKGe-NLQVLJ4-r1IXek4ceEKbvbYZq_Sk7oRasbrmRTXOLg8jSkRNi7kcIOaO8Ed3Pz7p_mC2MPzF3Y4v7_gPu0vGzWF0rwma0PbCkR7_-wQN-dNtIo9-X81J2vzHplL9fus_wFcUaYzA</recordid><startdate>20150601</startdate><enddate>20150601</enddate><creator>Kocharyan, V. 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| fulltext | fulltext |
| identifier | ISSN: 1600-5767 |
| ispartof | Journal of applied crystallography, 2015-06, Vol.48 (3), p.853-856 |
| issn | 1600-5767 0021-8898 1600-5767 |
| language | eng |
| recordid | cdi_proquest_journals_1684620532 |
| source | Wiley-Blackwell Read & Publish Collection |
| subjects | Crystals Diffraction external temperature gradients interplanar spacing Temperature temperature distribution X-ray diffraction |
| title | X-ray diffraction method for determination of interplanar spacing and temperature distribution in crystals under an external temperature gradient |
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