Study on mechanisms of InGaP/GaAs HBT safe operating area using TCAD simulation

The safe operating area (SOA) of InGaP/GaAs heterojunction bipolar transistors has been studied using two-dimensional Technology Computer-Aided Design (TCAD) tool. Comprehensive physical models, including hydrodynamic transport-based impact ionization and self-heating models were implemented. The si...

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Bibliographic Details
Published in:International journal of microwave and wireless technologies 2015-06, Vol.7 (3-4), p.279-285
Main Authors: Tao, Nick G.M., Lin, Bo-Rong, Lee, Chien-Ping, Henderson, Tim, Lin, Barry J.F.
Format: Article
Language:English
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Research Papers
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Summary:The safe operating area (SOA) of InGaP/GaAs heterojunction bipolar transistors has been studied using two-dimensional Technology Computer-Aided Design (TCAD) tool. Comprehensive physical models, including hydrodynamic transport-based impact ionization and self-heating models were implemented. The simulations for two DC modes (constant Ib and Vb modes) captured all the SOA features observed in measurements and some failure mechanisms were revealed for the first time by TCAD simulations. The simulated results are also in agreement with analytical modeling. The simulation not only gives us insight to the detailed failure mechanisms, but also provides guidance for the design of devices with better ruggedness and improved SOA performances.
ISSN:1759-0787
1759-0795
DOI:10.1017/S1759078715000495