Microwave dielectric properties of CaV^sub 2^O^sub 6^ ceramics with low dielectric loss

Novel glass-free low temperature firing microwave dielectric ceramics CaV^sub 2^O^sub 6^ with high Q was prepared through a conventional solid-state reaction method. The crystal phase and microstructures were studied by XRD and SEM. Orientation degree of CaV^sub 2^O^sub 6^ ceramics increased with an...

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Bibliographic Details
Published in:Journal of materials science. Materials in electronics 2015-10, Vol.26 (10), p.7719
Main Authors: Yao, Guo-guang, Pei, Cui-jin, Xu, Jian-gang, Liu, Peng, Zhou, Jian-ping, Zhang, Huai-wu
Format: Article
Language:English
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Summary:Novel glass-free low temperature firing microwave dielectric ceramics CaV^sub 2^O^sub 6^ with high Q was prepared through a conventional solid-state reaction method. The crystal phase and microstructures were studied by XRD and SEM. Orientation degree of CaV^sub 2^O^sub 6^ ceramics increased with an increase of sintering temperature. The Qxf values of CaV^sub 2^O^sub 6^ ceramics were strongly correlated with the densification and orientation degree. Typically, the CaV^sub 2^O^sub 6^ ceramics sintered at 675 °C possessed excellent microwave dielectric properties: [straight epsilon]^sub r^ = 10.2, Qxf = 123,000 GHz (at 10.2 GHz) and τ^sub f^ = -60 ppm/°C.
ISSN:0957-4522
1573-482X
DOI:10.1007/s10854-015-3414-4