Effect of Temperature on Formation and Stability of Shallow Trap at a Dielectric Interface of the Multilayer

• Published in: Journal of electronic materials 2015-12, Vol.44 (12), p.4655-4662
• Main Author: Rogti, F.
• Format: Article
• Language: English
• Subjects: Characterization and Evaluation of Materials; Chemistry and Materials Science; Dielectric properties; Electronics and Microelectronics; Instrumentation; Interfaces; Materials Science; Optical and Electronic Materials; Solid State Physics; Temperature effects
• ISSN: 0361-5235; 1543-186X
• DOI: 10.1007/s11664-015-4052-6

Space-charge behavior at dielectric interfaces in multilayer low-density polyethylene (LDPE) and fluorinated ethylene propylene (FEP) subjected to a direct-current (DC) field has been investigated as a function of temperature using the pulsed electroacoustic technique. A sandwich structure constituted by two nonidentical LDPE/FEP dielectric films was used to study the charging propensity of electrode/dielectric and dielectric/dielectric interfaces. The time dependence of the space-charge distribution was subsequently recorded at four temperatures, 20°C, 25°C, 40°C, and 60°C, under field (polarization) and short-circuit (depolarization) conditions. The experimental results demonstrate that temperature plays a significant role in the space-charge dynamics at the dielectric interface. It affects the charge injection, increases the charge mobility and electrical conductivity, and increases the density of shallow traps and trap filling. It is found that traps formed during polarization at high temperature do not remain stable after complete discharge of the multidielectric structure and when poled at low temperatures.